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The images produced
by near-field microscopy are not only instructional and revealing, but
they can be quite beautiful as well. We present the following archival
images and applications for your viewing pleasure. Should you wish to
use any of these copyrighted images, please contact us for permission.
Click on the thumbnails to expand.
Nano-Optic Applications
- Data Storage: Flying-head/media interface and air-bearing
- Wear scars
- Impact indent analysis
- Bearing surfaces and bearing ratio
- Crack propagation
- Real-time scratch creation and measurement
  
- Motherglass topography and defects
- Polymer alignment film topography
- Diffuser substrates
- Polished glass
- Fractures in glass
- Etched glass
- Sol Gel glass
- Precision ground glass
  
- Projection television optics
- Intraocular lenses
- Flycut zinc sulfide and other infra-red optics
- Diamond tool inspection
- Kinoforms
 
- Kinoforms
- Binary diffraction optics
- Holographic diffraction optics
- Holographically produced gratings
- Metrology
- Latent image in master
- QC and defect analysis of master, stamper, substrates,
and coatings
- Base evaluation for embossed structures
- Flying height measurement for near-field storage
  
- Joint replacements to potato chip bags
 
- Crazing and cracking--adhesion failure
- Substrate evaluation
- Substrate profiling (print-through)
- Thickness measurement
- Multilayer stacks: interfacial roughness
- Surface roughness of coating
- Metal thin films
- Surface plasmons
  
- Imaging of polymer single crystals
- Dewetting of polystyrene films
- Block copolymers
- Film formation of polymer latex
- Diheptyl azoxy benzene
- Liquid crystals
- Langmuir-Blodgett monolayers
- Latex biological barriers
- Polymer Industrial Bases and Coatings
    
    
- Silica dioxide on polycarbonate
- Siloxane on polycarbonate
- Siloxane on amorphous carbon
- Diamon-like carbon (DLC) on acrylic
- Chemical attack on DLC
- Chemical attack on DLC coated ferrite
- Delaminated multilayer coating
   
    
  
- Radius of curvature measurement
- Single fibers
- Extruded carbon fibers
- Fibers in matrix
- Multiple tunneling
- Fiber interfacial adhesion and roughness
 
- Head metrology
- Flying height measurement
- Media evaluation (floppy and hard)
- Wear tracks
 
- Pattern replication
- Deep submicron linewidth metrology
- Etched surfaces
- Surface roughness of wafer and surface coatings
- Porous silicon
- Semiconductor devices
- Metallized semiconductors
- X-ray mask evaluation
- Surface states
- Latent images in undeveloped photoresist
- Microlithography with PTM
    
    
 
- Cell substrate adhesion
- Patfinding by neuroblastoma cells
- Cell engulfment and chemotaxis
- Blood celss (Erythrocytes)
- Epidermal studies
- Bacteria
- Tobacco virus
- Botanical samples
- Soil nematodes
- Diatoms
    
- Perovskite
- Muscovite
- Highly ordered pyrolitic graphite
- Other minerals
  
- Data storage
- Bio-tech
- Telecom
- Energy
- Displays
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