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NFNow!™
Software
NFNow!™ is a rigorous analytical method based on the
Method of Auxilliary Sources developed by Dr. Fridon Shubitidze, with
Nanoptek's intuitive GUI and other proprietary features written by Dr.
Dmitri Vezenov. It is designed to run electromagnetic analysis
of nano-optical structures quickly on a desktop PC. NFNow!
can generate movies of the near-field as focus or illumination traverses
the nano-optics. The calculation below shows the interaction of
light with titania nano-optics embedded in polycarbonate. The
nano-optics are 370 nm wide and 200 nm thick. We use this software internally
for our own photocatalyst development and have no plans to sell it at
this time.
Features:
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User-defined interface: n and k, size, shape,
pitch--even import actual profile data from PTM or AFM
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Multiple layers.
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User-defined illumination: wavelength, numerical
aperture, gaussian, focus, beam waste, position with respect to
axis of optic, or use collimated plane wave illumination
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Very fast results on a desktop computer
Absorption at focal plane
Poynting vector field in near-field
  
TE (left), circular (center), and TM (right) polarizations
 
Near-field for low (left) and for high (right)
optics
 
Far-field intensity distribution pattern (polar
plot) for low (left) and high (right optics)
Global optimization for parameters such as contrast
and reflectivity for a given layer stack
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